@misc{indiciae03bf023b584b,
  title = {Bridging the Simulation-to-Reality Gap in Electron Microscope Calibration via VAE-EM Estimation},
  author = {Jilles S. van Hulst and W. P. M. H. Heemels and Duarte J. Antunes},
  year = {2026},
  url = {https://arxiv.org/abs/2603.16549},
  note = {Source identifier: 2603.16549}
}