TY  - RPRT
TI  - Bridging the Simulation-to-Reality Gap in Electron Microscope Calibration via VAE-EM Estimation
AU  - Jilles S. van Hulst
AU  - W. P. M. H. Heemels
AU  - Duarte J. Antunes
PY  - 2026
UR  - https://arxiv.org/abs/2603.16549
ID  - 2603.16549
ER  -