TY  - RPRT
TI  - Stability of Charge Collection Efficiency and Time Resolution in 4H-SiC PIN Diodes Under X-ray Irradiation
AU  - Jiaqi Zhou
AU  - Sen Zhao
AU  - Xiyuan Zhang
AU  - Suyu Xiao
AU  - Chenxi Fu
AU  - Congcong Wang
AU  - Yanpeng Li
AU  - Weimin Song
AU  - Xin Shi
PY  - 2026
UR  - https://arxiv.org/abs/2603.18547
ID  - 2603.18547
ER  -