TY - RPRT TI - Data-driven discovery of roughness descriptors for surface characterization and intimate contact modeling of unidirectional composite tapes AU - Sebastian Rodriguez AU - Mikhael Tannous AU - Jad Mounayer AU - Camilo Cruz AU - Anais Barasinski AU - Francisco Chinesta PY - 2026 UR - https://arxiv.org/abs/2603.20418 ID - 2603.20418 ER -