@misc{indiciae7b7e698551ea,
  title = {Gate-Drain Leakage Enhanced by Drain-Induced Dielectric Barrier Lowering in Gate-All-Around Field Effect Transistors},
  author = {Juan P. Mendez and Coleman Cariker and Michael Titze and Alex A. Belianinov and Denis Mamaluy},
  year = {2026},
  url = {https://arxiv.org/abs/2603.21015},
  note = {Source identifier: 2603.21015}
}