TY  - RPRT
TI  - Gate-Drain Leakage Enhanced by Drain-Induced Dielectric Barrier Lowering in Gate-All-Around Field Effect Transistors
AU  - Juan P. Mendez
AU  - Coleman Cariker
AU  - Michael Titze
AU  - Alex A. Belianinov
AU  - Denis Mamaluy
PY  - 2026
UR  - https://arxiv.org/abs/2603.21015
ID  - 2603.21015
ER  -