TY  - RPRT
TI  - Computational Insights into PEMFC Durability: Degradation Mechanisms, Interfacial Chemistry, and the Emerging Role of Machine Learning Potentials
AU  - Jack Jon Hinsch
AU  - Kazushi Fujimoto
PY  - 2026
UR  - https://arxiv.org/abs/2603.26022
ID  - 2603.26022
ER  -