TY  - RPRT
TI  - Electrostatic Effects of Self Trapped Holes in Gallium Oxide Devices
AU  - Nathan Wriedt
AU  - Joe McGlone
AU  - Davide Orlandini
AU  - Siddharth Rajan
PY  - 2026
UR  - https://arxiv.org/abs/2603.26958
ID  - 2603.26958
ER  -