TY  - RPRT
TI  - LLMs taking shortcuts in test generation: A study with SAP HANA and LevelDB
AU  - Vekil Bekmyradov
AU  - Noah C. Pütz
AU  - Thomas Bartz-Beielstein
PY  - 2026
UR  - https://arxiv.org/abs/2604.14437
ID  - 2604.14437
ER  -