@misc{indiciae95e611277433,
  title = {Microscopic Modeling of Surface Roughness Scattering in Inversion Layers of MOSFETs Based on Ando's Linear Model},
  author = {Nobuyuki Sano},
  year = {2026},
  url = {https://arxiv.org/abs/2604.22155},
  note = {Source identifier: 2604.22155}
}