TY  - RPRT
TI  - Microscopic Modeling of Surface Roughness Scattering in Inversion Layers of MOSFETs Based on Ando's Linear Model
AU  - Nobuyuki Sano
PY  - 2026
UR  - https://arxiv.org/abs/2604.22155
ID  - 2604.22155
ER  -