@misc{indiciae777c0f05421b,
  title = {Stochastic first-passage modeling of single-event burnout in SiC power MOSFETs},
  author = {Feiyi Liu and Min Guo and Shiyang Chen and Yuhan Jiang and Mingyang Liu and Yang Wang},
  year = {2026},
  url = {https://arxiv.org/abs/2605.02478},
  note = {Source identifier: 2605.02478}
}