TY  - RPRT
TI  - Classification and Metrization of Classes of Smooth measures
AU  - Takumu Ooi
AU  - Kaneharu Tsuchida
AU  - Toshihiro Uemura
PY  - 2026
UR  - https://arxiv.org/abs/2605.05864
ID  - 2605.05864
ER  -