TY  - RPRT
TI  - Characterization of large diameter ultra-thin vacuum windows for soft X-ray applications
AU  - K. Desch
AU  - E. Ferrer-Ribas
AU  - F. J. Iguaz
AU  - J. von Oy
AU  - A. Quintana
AU  - T. Schiffer
PY  - 2026
UR  - https://arxiv.org/abs/2605.12234
ID  - 2605.12234
ER  -