@misc{indiciaefc70ee3cff5e,
  title = {Direct On-Wafer Measurements of Noise Parameters in C- and X-bands at \$T=4\$ K},
  author = {Daniil Frolov and Jean-Olivier Plouchart and Utku Soylu},
  year = {2026},
  url = {https://arxiv.org/abs/2605.17073},
  note = {Source identifier: 2605.17073}
}