TY  - RPRT
TI  - Direct On-Wafer Measurements of Noise Parameters in C- and X-bands at $T=4$ K
AU  - Daniil Frolov
AU  - Jean-Olivier Plouchart
AU  - Utku Soylu
PY  - 2026
UR  - https://arxiv.org/abs/2605.17073
ID  - 2605.17073
ER  -