TY  - RPRT
TI  - Quantifying the coupling between strain and cation valence in high entropy oxide thin films using electron microscopy
AU  - Sai Venkata Gayathri Ayyagari
AU  - Saeed SI Almishal
AU  - Debangshu Mukherjee
AU  - Kevin M. Roccapriore
AU  - Jon-Paul Maria
AU  - Nasim Alem
PY  - 2026
UR  - https://arxiv.org/abs/2605.21612
ID  - 2605.21612
ER  -