@misc{indiciae230a43be3d98,
  title = {Impact of Surface Treatment on Noise in PL-Measurements of Silicon Vacancies in 4H-SiC Lateral pin-Diodes},
  author = {Jannik H. Schwarberg and Fabian Magerl and Susanne Beuer and Alexander May and Christian Gobert and Martin Siebert and Christian Miersch and Heino Möller and Wolfgang Knolle and Chihang Luo and Jan F. Dick and Franziska C. Beyer and Mathias Rommel and Jörg Schulze},
  year = {2026},
  doi = {10.1021/acs.nanolett.6c00646},
  url = {https://arxiv.org/abs/2605.24157},
  note = {Source identifier: 2605.24157}
}