@misc{indiciaeda41a7b6c910,
  title = {From Full Boards to Tiny Defects: Scale-Aware Tile Inference with Topology-Aware Merging for High-Resolution PCB Defect Detection},
  author = {Mohammad Alijanpour Shalmani and Alale Rezvani Boroujeni and Ali Amini and Jiann Shiun Yuan},
  year = {2026},
  url = {https://arxiv.org/abs/2605.24726},
  note = {Source identifier: 2605.24726}
}