@misc{indiciaed982081aff85,
  title = {Defect engineering of ultrathin gallium nitride via electric fields for advanced electronic, magnetic, and gas sensing applications},
  author = {Yujia Tian and Devesh R. Kripalani and Ming Xue and Kun Zhou},
  year = {2026},
  doi = {10.1021/acsnano.5c15014},
  url = {https://arxiv.org/abs/2605.26817},
  note = {Source identifier: 2605.26817}
}