TY  - RPRT
TI  - Defect engineering of ultrathin gallium nitride via electric fields for advanced electronic, magnetic, and gas sensing applications
AU  - Yujia Tian
AU  - Devesh R. Kripalani
AU  - Ming Xue
AU  - Kun Zhou
PY  - 2026
DO  - 10.1021/acsnano.5c15014
UR  - https://arxiv.org/abs/2605.26817
ID  - 2605.26817
ER  -