@misc{indiciaec825bfc629ec,
  title = {Individual Characterization of Fast-Responding Trap States at the NO-Annealed SiO\$\_2\$/4H-SiC Interface},
  author = {Takahiro Ono and Mizuki Ohashi and Tomohiro Shigeno and Yutaro Uchida and Yuuki Yasui and Koji Kita and Yoshiaki Sugimoto},
  year = {2026},
  url = {https://arxiv.org/abs/2605.27041},
  note = {Source identifier: 2605.27041}
}