TY  - RPRT
TI  - Individual Characterization of Fast-Responding Trap States at the NO-Annealed SiO$_2$/4H-SiC Interface
AU  - Takahiro Ono
AU  - Mizuki Ohashi
AU  - Tomohiro Shigeno
AU  - Yutaro Uchida
AU  - Yuuki Yasui
AU  - Koji Kita
AU  - Yoshiaki Sugimoto
PY  - 2026
UR  - https://arxiv.org/abs/2605.27041
ID  - 2605.27041
ER  -