TY  - RPRT
TI  - Barrier-channel intermixing and 2-dimensional electron gas degradation in Al-rich Al(Ga)N/AlGaN high electron mobility transistor heterostructures
AU  - Pietro Pampili
AU  - Vitaly Z. Zubialevich
AU  - Badal Mondal
AU  - Jayjit Mukherjee
AU  - Stefan Schulz
AU  - David A. J. Moran
AU  - Peter J. Parbrook
PY  - 2026
UR  - https://arxiv.org/abs/2606.04842
ID  - 2606.04842
ER  -