@misc{indiciae3d6e9c4585f1,
  title = {Real-Time Industrial Defect Detection on Edge Hardware Using Fine-Tuned YOLOv8: A Systematic Benchmark on the NEU Surface Defect Database and MVTec AD with Automotive \& Battery Manufacturing Extensions},
  author = {Emmanuel Ezeji Somtochukwu and Nitesh Rijal},
  year = {2026},
  url = {https://arxiv.org/abs/2606.07659},
  note = {Source identifier: 2606.07659}
}