TY  - RPRT
TI  - Real-Time Industrial Defect Detection on Edge Hardware Using Fine-Tuned YOLOv8: A Systematic Benchmark on the NEU Surface Defect Database and MVTec AD with Automotive & Battery Manufacturing Extensions
AU  - Emmanuel Ezeji Somtochukwu
AU  - Nitesh Rijal
PY  - 2026
UR  - https://arxiv.org/abs/2606.07659
ID  - 2606.07659
ER  -