@misc{indiciae4b80dd07e2a7,
  title = {Deep-level engineering in aluminum nitride (AlN) enables reliable photodetection in extreme conditions},
  author = {Jiahao Dong and Zhenjing Liu and Sara Tulchinsky and Rafael Jaramillo},
  year = {2026},
  url = {https://arxiv.org/abs/2606.07807},
  note = {Source identifier: 2606.07807}
}