TY  - RPRT
TI  - Deep-level engineering in aluminum nitride (AlN) enables reliable photodetection in extreme conditions
AU  - Jiahao Dong
AU  - Zhenjing Liu
AU  - Sara Tulchinsky
AU  - Rafael Jaramillo
PY  - 2026
UR  - https://arxiv.org/abs/2606.07807
ID  - 2606.07807
ER  -