@misc{indiciae57c2315c8e55,
  title = {Silicon Photonics Testing: Design for Testability, Fault Detection, and Manufacturing Variation Analysis in Photonic Integrated Circuits},
  author = {Pratishtha Agnihotri and Priyank Kalla and Steve Blair},
  year = {2026},
  url = {https://arxiv.org/abs/2606.08885},
  note = {Source identifier: 2606.08885}
}