TY  - RPRT
TI  - Silicon Photonics Testing: Design for Testability, Fault Detection, and Manufacturing Variation Analysis in Photonic Integrated Circuits
AU  - Pratishtha Agnihotri
AU  - Priyank Kalla
AU  - Steve Blair
PY  - 2026
UR  - https://arxiv.org/abs/2606.08885
ID  - 2606.08885
ER  -