TY  - RPRT
TI  - Fault Characterization and Hardening of Combinational Standard Cells Using 3D-TCAD Simulations for Cyber-Physical Systems
AU  - Ali Zarei
AU  - Amir M. Hajisadeghi
AU  - Hamid R. Zarandi
PY  - 2026
UR  - https://arxiv.org/abs/2606.10015
ID  - 2606.10015
ER  -