@misc{indiciae69da80c424cd,
  title = {Characterization of ultrathin nickel films deposited by thermal laser evaporation},
  author = {David S. Catherall and Yifei Yan and Finley B. Donachie and Azmain A. Hossain and Austin J. Minnich},
  year = {2026},
  doi = {10.1063/5.0309594},
  url = {https://arxiv.org/abs/2606.17336},
  note = {Source identifier: 2606.17336}
}