TY  - RPRT
TI  - Characterization of ultrathin nickel films deposited by thermal laser evaporation
AU  - David S. Catherall
AU  - Yifei Yan
AU  - Finley B. Donachie
AU  - Azmain A. Hossain
AU  - Austin J. Minnich
PY  - 2026
DO  - 10.1063/5.0309594
UR  - https://arxiv.org/abs/2606.17336
ID  - 2606.17336
ER  -