TY  - RPRT
TI  - Riemann invariant-based alternative WENO scheme for a two-layer thin film model
AU  - Biswarup Biswas
AU  - Rahul Barthwal
AU  - Rakesh Kumar
PY  - 2026
UR  - https://arxiv.org/abs/2606.17862
ID  - 2606.17862
ER  -