TY  - RPRT
TI  - Thickness-Dependent Interlayer Coupling and Semiconductor-to-Semimetal Crossover in Arsenene Multilayers
AU  - Jeonghwan Ahn
AU  - Seoung-Hun Kang
AU  - Jaron T. Krogel
PY  - 2026
UR  - https://arxiv.org/abs/2606.19780
ID  - 2606.19780
ER  -