@misc{indiciae927116d0b0c3,
  title = {A single platform with van der Pauw geometry for measurement of Seebeck coefficient, resistivity, and Hall effect of thin films},
  author = {Niraj Kumar Singh and Martin Falk and Per-Anton Schön Wallander and Per Sandström and Per Eklund and Arnaud le Febvrier},
  year = {2026},
  url = {https://arxiv.org/abs/2606.28137},
  note = {Source identifier: 2606.28137}
}