TY  - RPRT
TI  - A single platform with van der Pauw geometry for measurement of Seebeck coefficient, resistivity, and Hall effect of thin films
AU  - Niraj Kumar Singh
AU  - Martin Falk
AU  - Per-Anton Schön Wallander
AU  - Per Sandström
AU  - Per Eklund
AU  - Arnaud le Febvrier
PY  - 2026
UR  - https://arxiv.org/abs/2606.28137
ID  - 2606.28137
ER  -