TY  - RPRT
TI  - Negative Resistance Caused by Intra-Loop Coupling in Virtual-Admittance-Based Grid-Forming Control
AU  - Jaekeun Lee
AU  - Minwoo Jeong
AU  - Jae-Jung Jung
AU  - Xiongfei Wang
AU  - Shenghui Cui
PY  - 2026
UR  - https://arxiv.org/abs/2606.28705
ID  - 2606.28705
ER  -