@misc{indiciae655d2c181ea3,
  title = {High-Mobility and High-Reliability Top-Gate Oxide Semiconductor Transistors by Oxygen Engineering},
  author = {Kai Jiang and Zhiyu Lin and Ziheng Wang and Chen Wang and Mengwei Si},
  year = {2026},
  url = {https://arxiv.org/abs/2606.31217},
  note = {Source identifier: 2606.31217}
}