TY  - RPRT
TI  - High-Mobility and High-Reliability Top-Gate Oxide Semiconductor Transistors by Oxygen Engineering
AU  - Kai Jiang
AU  - Zhiyu Lin
AU  - Ziheng Wang
AU  - Chen Wang
AU  - Mengwei Si
PY  - 2026
UR  - https://arxiv.org/abs/2606.31217
ID  - 2606.31217
ER  -