TY  - RPRT
TI  - Bridging Quantum Computing Paradigms toward Semiconductor Yield: A Controlled CV-versus-DV Comparison on Wafer-Map Defect Classification
AU  - Yeonhong Kim
AU  - Jonghyeok Im
AU  - Monu Nath Baitha
AU  - Kyoungsik Kim
PY  - 2026
UR  - https://arxiv.org/abs/2607.00961
ID  - 2607.00961
ER  -