@misc{indiciae6fcc59f270da,
  title = {Electric-field effects on defect migration energetics in GaN},
  author = {Farshid Reza and Hamdy Arkoub and Alexander S. Hauck and Adri C. T. van Duin and Miaomiao Jin},
  year = {2026},
  url = {https://arxiv.org/abs/2607.01160},
  note = {Source identifier: 2607.01160}
}