TY  - RPRT
TI  - Electric-field effects on defect migration energetics in GaN
AU  - Farshid Reza
AU  - Hamdy Arkoub
AU  - Alexander S. Hauck
AU  - Adri C. T. van Duin
AU  - Miaomiao Jin
PY  - 2026
UR  - https://arxiv.org/abs/2607.01160
ID  - 2607.01160
ER  -