TY  - RPRT
TI  - Evidence of length scale effect in contact electrification in conducting thin film heterostructures
AU  - Paul C. Lou
AU  - Ravindra G. Bhardwaj
AU  - Anand Katailiha
AU  - W. P. Beyermann
AU  - Sandeep Kumar
PY  - 2026
UR  - https://arxiv.org/abs/2607.03428
ID  - 2607.03428
ER  -