@misc{indiciaedf1a930a4c43,
  title = {ICME 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing},
  author = {Wei Sun and Weixia Zhang and Linhan Cao and Mingkai Lu and Xiongkuo Min and Xiaoping Zhang and Patrick Le Callet and Guangtao Zhai and Hongxing Chen and Wenqi Wu and Zhenhao Hu and Shanshan Lin and Guanjie Huang and Kai Xie and Rui Xin and Zilong Zhao and Runmin Cong and Ningjing Li and Siqi Ma and Yi Jin Ong and Tianfei Zhou and Shunzhou Wang and Zhiyang Chen and Hao Fang and Chen Zhang and Tze-Hsiang Tang and Dikai Li and Xianjin Wu and Avinash Kumar Sharma and Zhaoyang Wang and Haiyong Chen and Binyi Su and Atik Shahariar},
  year = {2026},
  url = {https://arxiv.org/abs/2607.04675},
  note = {Source identifier: 2607.04675}
}