TY  - RPRT
TI  - SMART: A Machine Learning and Monte Carlo Framework for Rapid Analysis of Stochastic Transistor Aging and Process Variation in Digital Circuits
AU  - Arash Esshaghi
AU  - Siavash Es'haghi
AU  - Gholamreza Shahabadi
AU  - Alireza Moradi
PY  - 2026
UR  - https://arxiv.org/abs/2607.05187
ID  - 2607.05187
ER  -