@misc{indiciae905ef4c0669c,
  title = {Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films},
  author = {Ben Thornley and Thom R. Harris-Lee and Menno J. Kappers and Simon M. Fairclough and Rachel A. Oliver},
  year = {2026},
  url = {https://arxiv.org/abs/2607.07273},
  note = {Source identifier: 2607.07273}
}