TY  - RPRT
TI  - Best Practices for First-Principles Modeling of Amorphous Oxide Semiconductors: A Statistical Framework and Application to Zn-Sn-O
AU  - Michiel J. van Setten
AU  - Tonglin L. Newsom
AU  - Christopher Pashartis
AU  - Vera van Noort
AU  - Rebecca L. Peterson
AU  - Geoffrey Pourtois
PY  - 2026
UR  - https://arxiv.org/abs/2607.08667
ID  - 2607.08667
ER  -