TY  - RPRT
TI  - Spot Profile Analysis Low Energy Electron Diffraction of Plasma-Enhanced Chemical Vapor Deposition Grown Epitaxial Few-Layer Graphene on Sapphire
AU  - Niels Ganser
AU  - Marko A. Kriegel
AU  - Umut Kaya
AU  - Jixi Zhang
AU  - Rodney D. L. Smith
AU  - Marika Schleberger
AU  - Wolfgang Mertin
AU  - Gerd Bacher
AU  - Michael Horn-von Hoegen
PY  - 2026
UR  - https://arxiv.org/abs/2607.14922
ID  - 2607.14922
ER  -