@misc{indiciaef480fe0a1749,
  title = {Electron escape probability in high-efficiency photocathodes measured by reverse-injection photovoltage},
  author = {S. A. Rozhkov and D. A. Kustov and V. V. Bakin and V. S. Khoroshilov and V. L. Alperovich and O. E. Tereshchenko and H. E. Scheibler},
  year = {2026},
  url = {https://arxiv.org/abs/2607.18420},
  note = {Source identifier: 2607.18420}
}